High resolution TEM and triple-axis XRD investigation into porous silicon formed on highly conducting substrates
10.1016/j.electacta.2009.01.045
Saved in:
Main Authors: | Wijesinghe, T.L.S.L., Li, S.Q., Breese, M.B.H., Blackwood, D.J. |
---|---|
Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/86399 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Fabrication of patterned porous silicon using high-energy ion irradiation
by: Teo, E.J., et al.
Published: (2014) -
Fabrication of silicon microstructures using a high energy ion beam
by: Teo, E.J., et al.
Published: (2014) -
Three-dimensional micromachining of silicon using a nuclear microprobe
by: Teo, E.J., et al.
Published: (2014) -
Novel types of silicon waveguides fabricated using proton beam irradiation
by: Teo, E.J., et al.
Published: (2014) -
Fabrication of porous silicon channel waveguides with multilayer Bragg cladding
by: Bettiol, A.A., et al.
Published: (2014)