Modulated charged defects and conduction behaviour in doped BiFeO 3 thin films

10.1088/0022-3727/42/16/162001

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Bibliographic Details
Main Authors:	Wang, Y., Wang, J.
Other Authors:	MATERIALS SCIENCE AND ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/86554
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Institution:	National University of Singapore

Description
Summary:	10.1088/0022-3727/42/16/162001

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