Modulated charged defects and conduction behaviour in doped BiFeO 3 thin films
10.1088/0022-3727/42/16/162001
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sg-nus-scholar.10635-865542023-10-26T09:06:50Z Modulated charged defects and conduction behaviour in doped BiFeO 3 thin films Wang, Y. Wang, J. MATERIALS SCIENCE AND ENGINEERING 10.1088/0022-3727/42/16/162001 Journal of Physics D: Applied Physics 42 16 - JPAPB 2014-10-07T09:52:04Z 2014-10-07T09:52:04Z 2009 Article Wang, Y., Wang, J. (2009). Modulated charged defects and conduction behaviour in doped BiFeO 3 thin films. Journal of Physics D: Applied Physics 42 (16) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/42/16/162001 00223727 http://scholarbank.nus.edu.sg/handle/10635/86554 000268553600001 Scopus |
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10.1088/0022-3727/42/16/162001 |
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MATERIALS SCIENCE AND ENGINEERING |
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MATERIALS SCIENCE AND ENGINEERING Wang, Y. Wang, J. |
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Article |
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Wang, Y. Wang, J. |
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Wang, Y. Wang, J. Modulated charged defects and conduction behaviour in doped BiFeO 3 thin films |
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Wang, Y. |
title |
Modulated charged defects and conduction behaviour in doped BiFeO 3 thin films |
title_short |
Modulated charged defects and conduction behaviour in doped BiFeO 3 thin films |
title_full |
Modulated charged defects and conduction behaviour in doped BiFeO 3 thin films |
title_fullStr |
Modulated charged defects and conduction behaviour in doped BiFeO 3 thin films |
title_full_unstemmed |
Modulated charged defects and conduction behaviour in doped BiFeO 3 thin films |
title_sort |
modulated charged defects and conduction behaviour in doped bifeo 3 thin films |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/86554 |
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