Modulated charged defects and conduction behaviour in doped BiFeO 3 thin films
10.1088/0022-3727/42/16/162001
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Main Authors: | Wang, Y., Wang, J. |
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Other Authors: | MATERIALS SCIENCE AND ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/86554 |
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Institution: | National University of Singapore |
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