On the transient amorphous silicon structures during solid phase crystallization

On the transient amorphous silicon structures during solid phase crystallization

10.1016/j.jnoncrysol.2012.12.034

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Bibliographic Details
Main Authors: Law, F., Hidayat, H., Kumar, A., Widenborg, P., Luther, J., Hoex, B.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Amorphous silicon
Fourier transform infrared spectroscopy
In-situ X-ray diffraction
Keywords
Raman spectroscopy
Solid phase crystallization
Online Access:http://scholarbank.nus.edu.sg/handle/10635/86607
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/86607

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