Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry

10.1107/S1600576713031191

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Bibliographic Details
Main Authors: Yang, P., Liu, H., Chen, Z., Chen, L., Wang, J.
Other Authors: MATERIALS SCIENCE AND ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/86972
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Institution: National University of Singapore