Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry

• Main Authors: Yang, P., Liu, H., Chen, Z., Chen, L., Wang, J.
• Other Authors: MATERIALS SCIENCE AND ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Bravais lattice; crystal structure determination; epitaxial thin films; high-resolution X-ray diffractometry; Niggli-reduced cells; reciprocal-space vectors
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/86972
• Institution: National University of Singapore

10.1107/S1600576713031191