Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry
10.1107/S1600576713031191
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2014
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sg-nus-scholar.10635-869722023-10-31T07:14:45Z Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry Yang, P. Liu, H. Chen, Z. Chen, L. Wang, J. MATERIALS SCIENCE AND ENGINEERING SINGAPORE SYNCHROTRON LIGHT SOURCE Bravais lattice crystal structure determination epitaxial thin films high-resolution X-ray diffractometry Niggli-reduced cells reciprocal-space vectors 10.1107/S1600576713031191 Journal of Applied Crystallography 47 1 402-413 JACGA 2014-10-07T09:57:00Z 2014-10-07T09:57:00Z 2014-02 Conference Paper Yang, P., Liu, H., Chen, Z., Chen, L., Wang, J. (2014-02). Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry. Journal of Applied Crystallography 47 (1) : 402-413. ScholarBank@NUS Repository. https://doi.org/10.1107/S1600576713031191 00218898 http://scholarbank.nus.edu.sg/handle/10635/86972 000330485100049 Scopus |
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National University of Singapore |
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Singapore Singapore |
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Bravais lattice crystal structure determination epitaxial thin films high-resolution X-ray diffractometry Niggli-reduced cells reciprocal-space vectors |
| spellingShingle |
Bravais lattice crystal structure determination epitaxial thin films high-resolution X-ray diffractometry Niggli-reduced cells reciprocal-space vectors Yang, P. Liu, H. Chen, Z. Chen, L. Wang, J. Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry |
| description |
10.1107/S1600576713031191 |
| author2 |
MATERIALS SCIENCE AND ENGINEERING |
| author_facet |
MATERIALS SCIENCE AND ENGINEERING Yang, P. Liu, H. Chen, Z. Chen, L. Wang, J. |
| format |
Conference or Workshop Item |
| author |
Yang, P. Liu, H. Chen, Z. Chen, L. Wang, J. |
| author_sort |
Yang, P. |
| title |
Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry |
| title_short |
Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry |
| title_full |
Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry |
| title_fullStr |
Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry |
| title_full_unstemmed |
Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry |
| title_sort |
unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution x-ray diffractometry |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/86972 |
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1781784977868849152 |