Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry
10.1107/S1600576713031191
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Main Authors: | , , , , |
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Other Authors: | |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/86972 |
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Institution: | National University of Singapore |
Summary: | 10.1107/S1600576713031191 |
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