Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies

Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies

10.1109/24.475974

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Bibliographic Details
Main Authors: Tang, Loon Ching, Chang, Dong Shang
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/87206
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Institution: National University of Singapore
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Summary:10.1109/24.475974

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