Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies
10.1109/24.475974
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sg-nus-scholar.10635-872062015-03-23T13:22:27Z Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies Tang, Loon Ching Chang, Dong Shang INDUSTRIAL & SYSTEMS ENGINEERING 10.1109/24.475974 IEEE Transactions on Reliability 44 4 562-566 IEERA 2014-10-07T10:25:28Z 2014-10-07T10:25:28Z 1995-12 Article Tang, Loon Ching,Chang, Dong Shang (1995-12). Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies. IEEE Transactions on Reliability 44 (4) : 562-566. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/24.475974" target="_blank">https://doi.org/10.1109/24.475974</a> 00189529 http://scholarbank.nus.edu.sg/handle/10635/87206 NOT_IN_WOS Scopus |
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10.1109/24.475974 |
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INDUSTRIAL & SYSTEMS ENGINEERING |
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INDUSTRIAL & SYSTEMS ENGINEERING Tang, Loon Ching Chang, Dong Shang |
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Tang, Loon Ching Chang, Dong Shang |
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Tang, Loon Ching Chang, Dong Shang Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies |
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Tang, Loon Ching |
title |
Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies |
title_short |
Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies |
title_full |
Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies |
title_fullStr |
Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies |
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Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies |
title_sort |
reliability prediction using nondestructive accelerated-degradation data: case study on power supplies |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/87206 |
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