Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies
10.1109/24.475974
Saved in:
Main Authors: | Tang, Loon Ching, Chang, Dong Shang |
---|---|
Other Authors: | INDUSTRIAL & SYSTEMS ENGINEERING |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/87206 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies
by: Tang, Loon Ching, et al.
Published: (2014) -
Reliability Assessment and Lifetime Prediction of Degradation Processes Considering Recoverable Shock Damages
by: Tingting Huang, et al.
Published: (2021) -
Optimizations of power consumption and supply in the smart grid : analysis of the impact of data communication reliability
by: Niyato, Dusit, et al.
Published: (2013) -
The use of carrier fringes and FFT in holographic nondestructive testing
by: Quan, C., et al.
Published: (2014) -
Reliability prediction through degradation data modeling using a quasi-likelihood approach
by: Jayaram, J.S.R., et al.
Published: (2014)