Criterion for predicting delamination in plastic IC packages

Annual Proceedings - Reliability Physics (Symposium)

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Bibliographic Details
Main Authors: Tay, A.A.O., Tan, G.L., Lim, T.B.
Other Authors: INSTITUTE OF MICROELECTRONICS
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/92824
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Institution: National University of Singapore