Linear relationship between H+-trapping reaction energy and defect generation: Insight into nitrogen-enhanced negative bias temperature instability

10.1063/1.1593211

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Main Authors:	Tan, S.S., Chen, T.P., Soon, J.M., Loh, K.P., Ang, C.H., Teo, W.Y., Chan, L.
Other Authors:	CHEMISTRY
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/94158
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-941582023-10-30T22:21:31Z Linear relationship between H+-trapping reaction energy and defect generation: Insight into nitrogen-enhanced negative bias temperature instability Tan, S.S. Chen, T.P. Soon, J.M. Loh, K.P. Ang, C.H. Teo, W.Y. Chan, L. CHEMISTRY 10.1063/1.1593211 Applied Physics Letters 83 3 530-532 APPLA 2014-10-16T08:32:47Z 2014-10-16T08:32:47Z 2003-07-21 Article Tan, S.S., Chen, T.P., Soon, J.M., Loh, K.P., Ang, C.H., Teo, W.Y., Chan, L. (2003-07-21). Linear relationship between H+-trapping reaction energy and defect generation: Insight into nitrogen-enhanced negative bias temperature instability. Applied Physics Letters 83 (3) : 530-532. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1593211 00036951 http://scholarbank.nus.edu.sg/handle/10635/94158 000184186700042 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1063/1.1593211
author2	CHEMISTRY
author_facet	CHEMISTRY Tan, S.S. Chen, T.P. Soon, J.M. Loh, K.P. Ang, C.H. Teo, W.Y. Chan, L.
format	Article
author	Tan, S.S. Chen, T.P. Soon, J.M. Loh, K.P. Ang, C.H. Teo, W.Y. Chan, L.
spellingShingle	Tan, S.S. Chen, T.P. Soon, J.M. Loh, K.P. Ang, C.H. Teo, W.Y. Chan, L. Linear relationship between H+-trapping reaction energy and defect generation: Insight into nitrogen-enhanced negative bias temperature instability
author_sort	Tan, S.S.
title	Linear relationship between H+-trapping reaction energy and defect generation: Insight into nitrogen-enhanced negative bias temperature instability
title_short	Linear relationship between H+-trapping reaction energy and defect generation: Insight into nitrogen-enhanced negative bias temperature instability
title_full	Linear relationship between H+-trapping reaction energy and defect generation: Insight into nitrogen-enhanced negative bias temperature instability
title_fullStr	Linear relationship between H+-trapping reaction energy and defect generation: Insight into nitrogen-enhanced negative bias temperature instability
title_full_unstemmed	Linear relationship between H+-trapping reaction energy and defect generation: Insight into nitrogen-enhanced negative bias temperature instability
title_sort	linear relationship between h+-trapping reaction energy and defect generation: insight into nitrogen-enhanced negative bias temperature instability
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/94158
_version_	1781786051982917632

Linear relationship between H+-trapping reaction energy and defect generation: Insight into nitrogen-enhanced negative bias temperature instability

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