Linear relationship between H+-trapping reaction energy and defect generation: Insight into nitrogen-enhanced negative bias temperature instability

Linear relationship between H+-trapping reaction energy and defect generation: Insight into nitrogen-enhanced negative bias temperature instability

10.1063/1.1593211

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Bibliographic Details
Main Authors: Tan, S.S., Chen, T.P., Soon, J.M., Loh, K.P., Ang, C.H., Teo, W.Y., Chan, L.
Other Authors: CHEMISTRY
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/94158
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/94158

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