Study of negative-bias temperature-instability-induced defects using first-principle approach

10.1063/1.1614415

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Bibliographic Details
Main Authors: Soon, J.M., Loh, K.P., Tan, S.S., Chen, T.P., Teo, W.Y., Chan, L.
Other Authors: CHEMISTRY
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/94932
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Institution: National University of Singapore
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Summary:10.1063/1.1614415