Study of negative-bias temperature-instability-induced defects using first-principle approach
10.1063/1.1614415
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sg-nus-scholar.10635-949322024-11-12T21:10:02Z Study of negative-bias temperature-instability-induced defects using first-principle approach Soon, J.M. Loh, K.P. Tan, S.S. Chen, T.P. Teo, W.Y. Chan, L. CHEMISTRY 10.1063/1.1614415 Applied Physics Letters 83 15 3063-3065 APPLA 2014-10-16T08:41:51Z 2014-10-16T08:41:51Z 2003-10-13 Article Soon, J.M., Loh, K.P., Tan, S.S., Chen, T.P., Teo, W.Y., Chan, L. (2003-10-13). Study of negative-bias temperature-instability-induced defects using first-principle approach. Applied Physics Letters 83 (15) : 3063-3065. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1614415 00036951 http://scholarbank.nus.edu.sg/handle/10635/94932 000185832400025 Scopus |
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CHEMISTRY Soon, J.M. Loh, K.P. Tan, S.S. Chen, T.P. Teo, W.Y. Chan, L. |
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Soon, J.M. Loh, K.P. Tan, S.S. Chen, T.P. Teo, W.Y. Chan, L. |
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Soon, J.M. Loh, K.P. Tan, S.S. Chen, T.P. Teo, W.Y. Chan, L. Study of negative-bias temperature-instability-induced defects using first-principle approach |
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Soon, J.M. |
title |
Study of negative-bias temperature-instability-induced defects using first-principle approach |
title_short |
Study of negative-bias temperature-instability-induced defects using first-principle approach |
title_full |
Study of negative-bias temperature-instability-induced defects using first-principle approach |
title_fullStr |
Study of negative-bias temperature-instability-induced defects using first-principle approach |
title_full_unstemmed |
Study of negative-bias temperature-instability-induced defects using first-principle approach |
title_sort |
study of negative-bias temperature-instability-induced defects using first-principle approach |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/94932 |
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