Charging of deformed semicrystalline polymers observed with a scanning electron microscope
10.1109/94.484316
Saved in:
Main Authors: | Gong, H., Chooi, K.M., Ong, C.K. |
---|---|
Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/95983 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Determination of charge distribution volume in electron irradiated insulators by scanning electron microscope
by: Chen, H., et al.
Published: (2014) -
Charge Transport and Thermal Properties of A Semicrystalline Polymer Semiconductor
by: ZHAO LIHONG
Published: (2011) -
A novel scanning electron microscope method for the investigation of charge trapping in insulators
by: Gong, H., et al.
Published: (2014) -
New observation of surface pre-breakdown of polymethyl-methacrcylate in vacuum with a scanning electron microscope
by: Gong, H., et al.
Published: (2014) -
Charging identification and compensation in the scanning electron microscope
by: Wong, W.K., et al.
Published: (2014)