Measurement of phosphorus content in silica layers
Nuclear Inst. and Methods in Physics Research, B
Saved in:
Main Authors: | Loh, K.K., Sow, C.H., Tan, K.H., Tan, H.S., Tang, S.M., Orlic, I., Osipowicz, T. |
---|---|
Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/97159 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
New parameters for the calculation of L subshell ionization cross sections
by: Sow, C.H., et al.
Published: (2014) -
Computer simulation of PIXE and μ-PIXE spectra for inhomogeneous thick target analysis
by: Loh, K.K., et al.
Published: (2014) -
L X-ray production cross sections of medium Z elements for 0.4 to 2.0 MeV protons
by: Sow, C.H., et al.
Published: (2014) -
Reconstruction of Ar depth profiles from PIXE measurements
by: Osipowicz, T., et al.
Published: (2014) -
L X-ray production cross sections of medium Z elements by 4He ion impact
by: Orlić, I., et al.
Published: (2014)