Quantitative analysis of a-Si1 - XCx:H thin films
Applied Surface Science
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sg-nus-scholar.10635-976602015-02-03T00:29:14Z Quantitative analysis of a-Si1 - XCx:H thin films Gracin, D. Jakšić, M. Yang, C. Borjanović, V. Praček, B. PHYSICS Amorphous films Auger spectroscopy Backscattering Carbon content FTIR spectroscopy Hydrogen content Applied Surface Science 144-145 0 188-191 ASUSE 2014-10-16T09:37:50Z 2014-10-16T09:37:50Z 1999-04 Article Gracin, D.,Jakšić, M.,Yang, C.,Borjanović, V.,Praček, B. (1999-04). Quantitative analysis of a-Si1 - XCx:H thin films. Applied Surface Science 144-145 (0) : 188-191. ScholarBank@NUS Repository. 01694332 http://scholarbank.nus.edu.sg/handle/10635/97660 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Singapore |
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ScholarBank@NUS |
| topic |
Amorphous films Auger spectroscopy Backscattering Carbon content FTIR spectroscopy Hydrogen content |
| spellingShingle |
Amorphous films Auger spectroscopy Backscattering Carbon content FTIR spectroscopy Hydrogen content Gracin, D. Jakšić, M. Yang, C. Borjanović, V. Praček, B. Quantitative analysis of a-Si1 - XCx:H thin films |
| description |
Applied Surface Science |
| author2 |
PHYSICS |
| author_facet |
PHYSICS Gracin, D. Jakšić, M. Yang, C. Borjanović, V. Praček, B. |
| format |
Article |
| author |
Gracin, D. Jakšić, M. Yang, C. Borjanović, V. Praček, B. |
| author_sort |
Gracin, D. |
| title |
Quantitative analysis of a-Si1 - XCx:H thin films |
| title_short |
Quantitative analysis of a-Si1 - XCx:H thin films |
| title_full |
Quantitative analysis of a-Si1 - XCx:H thin films |
| title_fullStr |
Quantitative analysis of a-Si1 - XCx:H thin films |
| title_full_unstemmed |
Quantitative analysis of a-Si1 - XCx:H thin films |
| title_sort |
quantitative analysis of a-si1 - xcx:h thin films |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/97660 |
| _version_ |
1681091881398697984 |