Surface and interface studies of titanium silicide formation
Thin Solid Films
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sg-nus-scholar.10635-981232015-01-28T12:05:09Z Surface and interface studies of titanium silicide formation Wee, A.T.S. Huan, A.C.H. Osipowicz, T. Lee, K.K. Thian, W.H. Tan, K.L. Hogan, R. PHYSICS Rutherford backscattering spectroscopy; secondary ion mass spectrometry (SIMS) Silicides Titanium Thin Solid Films 283 1-2 130-134 THSFA 2014-10-16T09:43:18Z 2014-10-16T09:43:18Z 1996-09-01 Article Wee, A.T.S.,Huan, A.C.H.,Osipowicz, T.,Lee, K.K.,Thian, W.H.,Tan, K.L.,Hogan, R. (1996-09-01). Surface and interface studies of titanium silicide formation. Thin Solid Films 283 (1-2) : 130-134. ScholarBank@NUS Repository. 00406090 http://scholarbank.nus.edu.sg/handle/10635/98123 NOT_IN_WOS Scopus |
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Rutherford backscattering spectroscopy; secondary ion mass spectrometry (SIMS) Silicides Titanium |
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Rutherford backscattering spectroscopy; secondary ion mass spectrometry (SIMS) Silicides Titanium Wee, A.T.S. Huan, A.C.H. Osipowicz, T. Lee, K.K. Thian, W.H. Tan, K.L. Hogan, R. Surface and interface studies of titanium silicide formation |
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Thin Solid Films |
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PHYSICS |
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PHYSICS Wee, A.T.S. Huan, A.C.H. Osipowicz, T. Lee, K.K. Thian, W.H. Tan, K.L. Hogan, R. |
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Article |
author |
Wee, A.T.S. Huan, A.C.H. Osipowicz, T. Lee, K.K. Thian, W.H. Tan, K.L. Hogan, R. |
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Wee, A.T.S. |
title |
Surface and interface studies of titanium silicide formation |
title_short |
Surface and interface studies of titanium silicide formation |
title_full |
Surface and interface studies of titanium silicide formation |
title_fullStr |
Surface and interface studies of titanium silicide formation |
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Surface and interface studies of titanium silicide formation |
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surface and interface studies of titanium silicide formation |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/98123 |
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1681091966343839744 |