TOF study of pulsed-laser ablation of aluminum nitride for thin film growth
Applied Surface Science
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sg-nus-scholar.10635-984152015-01-09T00:05:11Z TOF study of pulsed-laser ablation of aluminum nitride for thin film growth Chu, C. Ong, P.P. Chen, H.F. Teo, H.H. PHYSICS Laser ablation Laser ionization time-of-flight mass spectrometry (TOF-MS) Pulsed-laser deposition (PLD) Applied Surface Science 137 1-3 91-97 ASUSE 2014-10-16T09:46:49Z 2014-10-16T09:46:49Z 1999-01-01 Article Chu, C.,Ong, P.P.,Chen, H.F.,Teo, H.H. (1999-01-01). TOF study of pulsed-laser ablation of aluminum nitride for thin film growth. Applied Surface Science 137 (1-3) : 91-97. ScholarBank@NUS Repository. 01694332 http://scholarbank.nus.edu.sg/handle/10635/98415 NOT_IN_WOS Scopus |
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Laser ablation Laser ionization time-of-flight mass spectrometry (TOF-MS) Pulsed-laser deposition (PLD) |
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Laser ablation Laser ionization time-of-flight mass spectrometry (TOF-MS) Pulsed-laser deposition (PLD) Chu, C. Ong, P.P. Chen, H.F. Teo, H.H. TOF study of pulsed-laser ablation of aluminum nitride for thin film growth |
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Applied Surface Science |
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PHYSICS |
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PHYSICS Chu, C. Ong, P.P. Chen, H.F. Teo, H.H. |
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Article |
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Chu, C. Ong, P.P. Chen, H.F. Teo, H.H. |
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Chu, C. |
title |
TOF study of pulsed-laser ablation of aluminum nitride for thin film growth |
title_short |
TOF study of pulsed-laser ablation of aluminum nitride for thin film growth |
title_full |
TOF study of pulsed-laser ablation of aluminum nitride for thin film growth |
title_fullStr |
TOF study of pulsed-laser ablation of aluminum nitride for thin film growth |
title_full_unstemmed |
TOF study of pulsed-laser ablation of aluminum nitride for thin film growth |
title_sort |
tof study of pulsed-laser ablation of aluminum nitride for thin film growth |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/98415 |
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1681092019798147072 |