TOF study of pulsed-laser ablation of aluminum nitride for thin film growth

TOF study of pulsed-laser ablation of aluminum nitride for thin film growth

Applied Surface Science

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書目詳細資料
Main Authors:	Chu, C., Ong, P.P., Chen, H.F., Teo, H.H.
其他作者:	PHYSICS
格式:	Article
出版:	2014
主題:	Laser ablation Laser ionization time-of-flight mass spectrometry (TOF-MS) Pulsed-laser deposition (PLD)
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/98415
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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