High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures

10.1016/S0168-583X(02)00470-6

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Bibliographic Details
Main Authors:	Osipowicz, T., Seng, H.L., Wielunski, L.S., Tok, E.S., Breton, G., Zhang, J.
Other Authors:	PHYSICS
Format:	Conference or Workshop Item
Published:	2014
Subjects:	Channeling contrast microscopy Virtual substrate
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/98740
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Institution:	National University of Singapore

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