High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures
10.1016/S0168-583X(02)00470-6
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Main Authors: | Osipowicz, T., Seng, H.L., Wielunski, L.S., Tok, E.S., Breton, G., Zhang, J. |
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Other Authors: | PHYSICS |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/98740 |
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Institution: | National University of Singapore |
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