Test optimization in DNN testing: A survey

• Main Authors: HU, Qiang, GUO, Yuejun, XIE, Xiaofei, CORDY, Maxime, MA, Lei, PAPADAKIS, Mike, LE TRAON, Yves
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2024
• Subjects: Test optimization; DNN testing; low-labeling cost; Databases and Information Systems; Software Engineering
• Online Access: https://ink.library.smu.edu.sg/sis_research/9094; https://ink.library.smu.edu.sg/context/sis_research/article/10097/viewcontent/3643678.pdf
• Institution: Singapore Management University

This article presents a comprehensive survey on test optimization in deep neural network (DNN) testing. Here, test optimization refers to testing with low data labeling effort. We analyzed 90 papers, including 43 from the software engineering (SE) community, 32 from the machine learning (ML) communi...