TLEL: A two-layer ensemble learning approach for just-in-time defect prediction

• Main Authors: YANG, Xinli, LO, David, XIA, Xin, SUN, Jianling
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2017
• Subjects: Ensemble learning; Just-in-time defect prediction; Cost effectiveness; Databases and Information Systems; Information Security
• Online Access: https://ink.library.smu.edu.sg/sis_research/3700; https://ink.library.smu.edu.sg/context/sis_research/article/4702/viewcontent/1_s20_S0950584917302501_main.pdf
• Institution: Singapore Management University

Context: Defect prediction is a very meaningful topic, particularly at change-level. Change-level defect prediction, which is also referred as just-in-time defect prediction, could not only ensure software quality in the development process, but also make the developers check and fix the defects in...