JITO: A tool for just-in-time defect identification and localization
In software development and maintenance, defect localization is necessary for software quality assurance. Current defect localization techniques mainly rely on defect symptoms (e.g., bug reports or program spectrum) when the defect has been exposed. One challenge task is: can we locate buggy program...
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Main Authors: | QIU, Fangcheng, YAN, Meng, XIA, Xin, WANG, Xinyu, FAN, Yuanrui, HASSAN, Ahmed E., LO, David |
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Format: | text |
Language: | English |
Published: |
Institutional Knowledge at Singapore Management University
2020
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Online Access: | https://ink.library.smu.edu.sg/sis_research/5537 https://ink.library.smu.edu.sg/context/sis_research/article/6540/viewcontent/3368089.3417927.pdf |
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Institution: | Singapore Management University |
Language: | English |
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