Optical interferometric technique for induced strain ferroelectric loop study at low frequency
Michelson interferometric technique was modified in the setup and used to measure very small changes in optical path length for electric field induced-strain phenomena. Induced-strain is established in the sample when the beam of light propagating through the sample surface undergoes a shift in phas...
محفوظ في:
| المؤلفون الرئيسيون: | , , , , |
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| التنسيق: | Book Series |
| منشور في: |
2018
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| الوصول للمادة أونلاين: | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84904052484&origin=inward http://cmuir.cmu.ac.th/jspui/handle/6653943832/45596 |
| الوسوم: |
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