Optical interferometric technique for induced strain ferroelectric loop study at low frequency

Michelson interferometric technique was modified in the setup and used to measure very small changes in optical path length for electric field induced-strain phenomena. Induced-strain is established in the sample when the beam of light propagating through the sample surface undergoes a shift in phas...

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Main Authors: Siripong Somwan, Khem Chirapatpimol, Apichart Limpichaipanit, Komsanti Chokethawai, Athipong Ngamjarurojana
格式: Book Series
出版: 2018
在線閱讀:https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84904052484&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/45596
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