Characterization of a compact filament-driven multicusp ion source for low energy time-of-flight Rutherford backscattering spectrometry application
The characterization of materials by ion beam based Rutherford backscattering spectroscopy (RBS) was studied. It was found that a compact filament-driven multicusp ion source was used for the time-of-flight RBS applications. The use of beam width to deduce the beam emittance and measurement at beam...
محفوظ في:
| المؤلفون الرئيسيون: | , , , , , , |
|---|---|
| التنسيق: | Conference or Workshop Item |
| اللغة: | English |
| منشور في: |
2014
|
| الوصول للمادة أونلاين: | http://www.scopus.com/inward/record.url?eid=2-s2.0-3042847010&partnerID=40&md5=67dc78452a59e8f4269e764b53d6c50d http://cmuir.cmu.ac.th/handle/6653943832/7175 |
| الوسوم: |
إضافة وسم
لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!
|
| المؤسسة: | Chiang Mai University |
| اللغة: | English |
| الملخص: | The characterization of materials by ion beam based Rutherford backscattering spectroscopy (RBS) was studied. It was found that a compact filament-driven multicusp ion source was used for the time-of-flight RBS applications. The use of beam width to deduce the beam emittance and measurement at beam profile monitor was investigated. Results shows the beam size and the beam divergence at the entrance of the quadrupole magnet. |
|---|