A review of curve fitting error criteria for solar cell I-V characteristics

by Phang, J.C.H., Chan, D.S.H.
Published 2014

Laparoscopic surgery should be considered in T4 colon cancer

by Chan D.K.H., Tan K.-K.
Published 2018

Anal adenocarcinoma presenting as a non-healing ischiorectal wound

by Chan D.K.H., Tan K.-K.
Published 2018

Stenting versus surgery in obstructed malignant colorectal cancer梐 review of short and long-term results

by Chan, D.K.H., Tan, K.-K.
Published 2021

Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model

by Kolachina, S., Phang, J.C.H., Chan, D.S.H.
Published 2014

Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model

by Kolachina, S., Phang, J.C.H., Chan, D.S.H.
Published 2014

SONOS type memory cell with ALD LaAlO blocking oxide for high speed operation

by He, W., Chan, D.S.H., Cho, B.-J.
Published 2014

Metal carbides for band-edge work function metal gate CMOS devices

by Hwang, W.S., Chan, D.S.H., Cho, B.J.
Published 2014

Effects of N2, O2, and Ar plasma treatments on the removal of crystallized HfO2 film

by Chen, J., Yoo, W.J., Chan, D.S.H.
Published 2014

Investigation of wet etching properties and annealing effects of Hf-based high-k materials

by Chen, J., Jong Yoo, W., Chan, D.S.H.
Published 2014

A novel floating gate engineering technique for improved data retention of flash memory devices

by Pu, J., Chan, D.S.H., Cho, B.J.
Published 2014

Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm

by Chim, W.K., Leang, S.E., Chan, D.S.H.
Published 2014

New purely-experimental technique for extracting the spatial distribution of hot-carrier-induced interface states and trapped charges in MOSFETs

by Leang, S.E., Chan, D.S.H., Chim, W.K.
Published 2014

Effect of micro-extraction field and physical dimensions on the charging dynamics of integrated circuit passivation layer probe-holes in the electron beam tester

by Sim, K.S., Phang, J.C.H., Chan, D.S.H.
Published 2014

A new gate current measurement technique for the characterization of hot-carrier induced degradation in MOSFETs

by Leang, S.E., Chim, W.K., Chan, D.S.H.
Published 2014

Characterization of hot-carrier degradation in non-isolated MOSFETs using a new gate-current measurement technique

by Leang, S.E., Chan, D.S.H., Chim, W.K.
Published 2014

New purely-experimental technique for extracting the spatial distribution of hot-carrier-induced interface states and trapped charges in MOSFETs

by Leang, S.E., Chan, D.S.H., Chim, W.K.
Published 2014

Investigation of the role of hot holes and hot electrons in the generation of interface states in submicrometre MOSFETs using a new charge-profiling technique based on charge-pumpi...

by Chan, D.S.H., Leang, S.E., Chim, W.K.
Published 2014

Spectroscopic observations of photon emissions in n-MOSFETs in the saturation region

by Tao, J.M., Chan, D.S.H., Chim, W.K.
Published 2014

Investigation of the role of hot holes and hot electrons in the generation of interface states in submicrometre MOSFETs using a new charge-profiling technique based on charge-pumpi...

by Chan, D.S.H., Leang, S.E., Chim, W.K.
Published 2014