Estimation of P-wave velocities for unsaturated geo-materials

by Leong, Eng Choon, Cheng, Z. Y.
Published 2013

Timoshenko beam effect in flexural resonant column tests

by Leong, Eng Choon, Cheng, Z. Y.
Published 2020

A model for minority carrier lifetime variation in the oxide-silicon structure following 253.7 nm ultraviolet irradiation

by Cheng, Z.Y., Ling, C.H.
Published 2014

An improved analysis for the determination of trap levels in silicon from laser microwave photoconductive decay measurements

by Ling, C.H., Cheng, Z.Y.
Published 2014

A steady state drain current technique for generation and recombination lifetime measurement in the SOI MOSFET

by Cheng, Z.Y., Ling, C.H.
Published 2014

Trap generation in CVD SiO2 subjected to 253.7nm ultraviolet irradiation

by Ling, C.H., Cheng, Z.Y.
Published 2014

Gate-channel capacitance characteristics in the fully-depleted SOI MOSFET

by Cheng, Z.-Y., Ling, C.H.
Published 2014

Gate-channel capacitance characteristics in the fully-depleted SOI MOSFET

by Cheng, Z.-Y., Ling, C.H.
Published 2014

Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides

by Ang, C.-H., Ling, C.-H., Cho, B.-J., Kim, S.-J., Cheng, Z.-Y.
Published 2014

Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides

by Ang, C.-H., Ling, C.-H., Cho, B.-J., Kim, S.-J., Cheng, Z.-Y.
Published 2014

Annealing of Fowler-Nordheim stress-induced leakage currents in thin silicon dioxide films

by Ang, C.H., Ling, C.H., Cheng, Z.Y., Kim, S.J., Cho, B.J.
Published 2014

Comparative study of radiation- and stress-induced leakage currents in thin gate oxides

by Ang, C.H., Ling, C.H., Cheng, Z.Y., Kim, S.J., Cho, B.J.
Published 2014

A Study of compressively strained Si0.5Ge0.5 metal-oxide-semiconductor capacitors with chemical vapor deposition HfAlO as gate dielectric

by Huang, J., Fu, J., Zhu, C., Tay, A.A.O., Cheng, Z.-Y., Leitz, C.W., Lochtefeld, A.
Published 2014

Surface NH 3 anneal on strained Si 0.5Ge 0.5 for metal-oxide-semiconductor applications with HfO 2 as gate dielectric

by Huang, J., Wu, N., Zhang, Q., Zhu, C., Li, M.F., Tay, A.A.O., Cheng, Z.-Y., Leitz, C.W., Lochtefeld, A.
Published 2014

Transplantation of a bioengineered serum-free derived conjunctival epithelial equivalent for the treatment of severe corneal and ocular surface disease

by Ang, L.P.K., Ang, L.P.S., Lim, L.S., Do, T.P., Thein, Z.M., Cheng, Z.-Y., Cajucom-Uy, H., Beuerman, R.W., Tan, D.T.H.
Published 2014