Estimation of the area of voids in deep-submicron aluminium interconnects using resistance-noise measurements

由 Chu, L.W., Pey, K.L., Chim, W.K., Loh, S.K., Er, E.
出版 2014

In silico prediction of the granzyme B degradome

由 Wee, L.J.K, Er, E.P.S, Ng, L.F.P, Tong, J.C
出版 2020

Reduction of local mechanical stress in a transistor using Si 3N4/SiOxNy, contact ESL

由 Toh, S.L., Loh, K.P., Boothroyd, C.B., Li, K., Ang, C.H., Er, E., Chan, L.
出版 2014

High spatial resolution strain measurement of deep sub-micron semiconductor devices using CBED

由 Toh, S.L., Li, K., Ang, C.H., Er, E., Redkar, S., Loh, K.P., Boothroyd, C.B., Chan, L.
出版 2014

Evaluation of the strain state in SiGe/Si heterostructures by high resolution X-ray diffraction and convergent beam electron diffraction

由 Toh, S.L., Li, K., Ang, C.H., Rao, R., Er, E., Loh, K.P., Boothroyd, C.B., Chan, L.
出版 2014