STUDIES IN X-RAY FLUORESCENCE QUANTITATIVE ANALYSIS AND STUDIES IN ANCIENT CHINESE PORCELAIN

by HUA YOUNAN
Published 2020

Magnetic stray field mapping of stainless steel sheets using spin Hall magnetoresistance sensor

by Lu, Ling, Li, Xiaomin, Hua, Younan, Wu, Yihong
Published 2022

Failure analysis of bond pad metal peeling using FIB and AFM

by Tan, Cher Ming, Er, Eddie, Hua, Younan, Chai, Vincent Siew Heong
Published 2009

Electron-beam radiation induced degradation of silicon nitride and its impact to semiconductor failure analysis by TEM

by Liu, Binghai, Dong, Zhi Li, Hua, Younan, Fu, Chao, Li, Xiaomin, Tan, Pik Kee, Zhao, Yuzhe
Published 2019

The overview of the impacts of electron radiation on semiconductor failure analysis by SEM, FIB and TEM

by Liu, Binghai, Hua, Younan, Dong, Zhili, Tan, Pik Kee, Zhao, Yuzhe, Mo, Zhiqiang, Lam, Jeffrey, Mai, Zhihong
Published 2020

One-step synthesis of metal/semiconductor heterostructure NbS2/MoS2

by Fu, Qundong, Wang, Xiaowei, Zhou, Jiadong, Xia, Juan, Zeng, Qinsheng, Lv, Danhui, Zhu, Chao, Wang, Xiaolei, Shen, Yue, Li, Xiaomin, Hua, Younan, Liu, Fucai, Shen, Zexiang, Jin, Chuanhong, Liu, Zheng
Published 2020