Interfacial polarization in Al-Y2O3-SiO2-Si capacitor

由 Ling, C.H.
出版 2014

Close correspondence between forward gated-diode and charge pumping currents observed in hot-carrier stressed PMOSFET's

由 Ling, C.H.
出版 2014

Electron trapping and interface state generation in PMOSFET's: Results from gate capacitance

由 Ling, C.H.
出版 2014

Observation of zero temperature coefficient of capacitance in the MOS capacitor

由 Ling, C.H.
出版 2014

Some characteristics of the zero-temperature-coefficient capacitance of an MOS capacitor in accumulation

由 Ling, C.H.
出版 2014

A diffusion model for carrier transport in a polycrystalline film

由 Ling, C.H.
出版 2014

Observation of a high-resistance to a low-resistance transition in a silicon bicrystal

由 Ling, C.H.
出版 2014

Trap generation at Si/SiO2 interface in submicrometer metal-oxide-semiconductor transistors by 4.9 eV ultraviolet irradiation

由 Ling, C.H.
出版 2014

Charge trapping in interpoly ONO film

由 Lira, K.S., Ling, C.H.
出版 2014

Teaching semiconductor device physics with two-dimensional numerical solver

由 Yeow, Y.T., Ling, C.H.
出版 2014

A unified model for the self-limiting hot-carrier degradation in LDD n-MOSFET's

由 Ang, D.S., Ling, C.H.
出版 2014

A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET

由 Ang, D.S., Ling, C.H.
出版 2014

On the time-dependent degradation of LDD n-MOSFETs under hot-carrier stress

由 Ang, D.S., Ling, C.H.
出版 2014

The role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-MOSFET's

由 Ang, D.S., Ling, C.H.
出版 2014

Effects of tungsten polycidation on the hot-carrier degradation in buried-channel LDD p-MOSFET's

由 Ang, D.S., Ling, C.H.
出版 2014

A novel experimental technique for the lateral profiling of oxide and interface state charges in hot-hole degraded N-MOSFET's

由 Ang, D.S., Ling, C.H.
出版 2014

On the dominant interface trap generation process during hot-carrier stressing

由 Ang, D.S., Ling, C.H.
出版 2014

A New Model for the Post-Stress Interface Trap Generation in Hot-Carrier Stressed P-MOSFET's

由 Ang, D.S., Ling, C.H.
出版 2014

A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement

由 Ang, D.S., Ling, C.H.
出版 2014

A comparison of hot-carrier degradation in tungsten polycide gate and poly gate p-MOSFETs

由 Ang, D.S., Ling, C.H.
出版 2014