Digital breakdown and switching behaviours in high-K dielectrics in nano-scale mosfets

by Liu, Wenhu.
Published 2013

Analysis of correlated gate and drain random telegraph noise in post-soft breakdownTiN/HfLaO/SiOx nMOSFETs

by Liu, Wenhu, Padovani, Andrea, Larcher, Luca, Raghavan, Nagarajan, Pey, Kin Leong
Published 2014

Percolative model and thermodynamic analysis of oxygen-ion-mediated resistive switching

by Raghavan, Nagarajan, Pey, Kin Leong, Wu, Xing, Liu, Wenhu, Bosman, Michel
Published 2013

Dielectric breakdown - recovery in logic and resistive switching in memory : bridging the gap between the two phenomena

by Pey, Kin Leong, Raghavan, Nagarajan, Wu, Xing, Liu, Wenhu, Bosman, Michel
Published 2013