TEKNIK WAFER BONDING DAN ETSA SELEKTIF DALAM FABRIKASI WAFER SOI

<b>ABSTRACK:</br></b><br /> <p align=\"justify\">Wafer bonding process have been done to support SOI wafer fabrication especially in ELTRAN and SMARTCUT methods, The good quality of wafer bonding was yield by using electrostatic forces (stress >2x105 N/m- )...

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Main Author: DARMA, YUDI
Format: Theses
Language:Indonesia
Online Access:https://digilib.itb.ac.id/gdl/view/1692
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Institution: Institut Teknologi Bandung
Language: Indonesia
id id-itb.:1692
spelling id-itb.:16922006-01-23T18:07:18ZTEKNIK WAFER BONDING DAN ETSA SELEKTIF DALAM FABRIKASI WAFER SOI DARMA, YUDI Indonesia Theses INSTITUT TEKNOLOGI BANDUNG https://digilib.itb.ac.id/gdl/view/1692 <b>ABSTRACK:</br></b><br /> <p align=\"justify\">Wafer bonding process have been done to support SOI wafer fabrication especially in ELTRAN and SMARTCUT methods, The good quality of wafer bonding was yield by using electrostatic forces (stress >2x105 N/m- ) with carbon electrodes that uses electrical potential around 24 V at 1150 °C. On the other hand wafer bonding process can be done by produce O-H clusters that can be made in H,O,:H,SO 4 (1: 1) mixture and continuing with heating treatment at 1150 °C (stress > 105 Mn- ). Besides, thinning and selective etching are also important process in SOI fabrication. KOH 30% have been chosen to etch silicon layers and yield 2,4 1tm/minute etching rate at 80° C. HF:H2Oz (l:5) mixture have been used to selective etching in porous silicon and give 0.1388 pm/minute etching rate at room temparature and 0.27 pm/minute at 100 °C. text
institution Institut Teknologi Bandung
building Institut Teknologi Bandung Library
continent Asia
country Indonesia
Indonesia
content_provider Institut Teknologi Bandung
collection Digital ITB
language Indonesia
description <b>ABSTRACK:</br></b><br /> <p align=\"justify\">Wafer bonding process have been done to support SOI wafer fabrication especially in ELTRAN and SMARTCUT methods, The good quality of wafer bonding was yield by using electrostatic forces (stress >2x105 N/m- ) with carbon electrodes that uses electrical potential around 24 V at 1150 °C. On the other hand wafer bonding process can be done by produce O-H clusters that can be made in H,O,:H,SO 4 (1: 1) mixture and continuing with heating treatment at 1150 °C (stress > 105 Mn- ). Besides, thinning and selective etching are also important process in SOI fabrication. KOH 30% have been chosen to etch silicon layers and yield 2,4 1tm/minute etching rate at 80° C. HF:H2Oz (l:5) mixture have been used to selective etching in porous silicon and give 0.1388 pm/minute etching rate at room temparature and 0.27 pm/minute at 100 °C.
format Theses
author DARMA, YUDI
spellingShingle DARMA, YUDI
TEKNIK WAFER BONDING DAN ETSA SELEKTIF DALAM FABRIKASI WAFER SOI
author_facet DARMA, YUDI
author_sort DARMA, YUDI
title TEKNIK WAFER BONDING DAN ETSA SELEKTIF DALAM FABRIKASI WAFER SOI
title_short TEKNIK WAFER BONDING DAN ETSA SELEKTIF DALAM FABRIKASI WAFER SOI
title_full TEKNIK WAFER BONDING DAN ETSA SELEKTIF DALAM FABRIKASI WAFER SOI
title_fullStr TEKNIK WAFER BONDING DAN ETSA SELEKTIF DALAM FABRIKASI WAFER SOI
title_full_unstemmed TEKNIK WAFER BONDING DAN ETSA SELEKTIF DALAM FABRIKASI WAFER SOI
title_sort teknik wafer bonding dan etsa selektif dalam fabrikasi wafer soi
url https://digilib.itb.ac.id/gdl/view/1692
_version_ 1820663034318684160