Electrical transport properties of PbSn1-xTe thin films and Pb1-xSnxTe bulk samples
PbxSn1-xTe thin films deposited by vapor technique and Pb1-xSnxTe bulk samples grown by horizontal unseeded vapor phased growth (HUGV) were characterized through its electronic transport properties. These include resistivity and Hall measurements varied from a temperature of 77K-373K and from 77K-30...
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| Main Authors: | , |
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| Format: | text |
| Language: | English |
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Animo Repository
1996
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| Subjects: | |
| Online Access: | https://animorepository.dlsu.edu.ph/etd_bachelors/4158 |
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| Institution: | De La Salle University |
| Language: | English |