An extended unified Schottky-Poole-Frenkel theory to explain the current-voltage characteristics of capacitors using high-k dielectric materials

• Main Author: Lau, Wai Shing.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/100826; http://hdl.handle.net/10220/11050
• Institution: Nanyang Technological University

Historically, there is a controversy regarding the current-voltage (I-V) characteristics of thin film MIM (metal-insulator-metal) capacitors, which is quite frequently modeled by either the Schottky model or the Poole-Frenkel model. In this letter, the author points out that the two models actually...