An extended unified Schottky-Poole-Frenkel theory to explain the current-voltage characteristics of capacitors using high-k dielectric materials
Historically, there is a controversy regarding the current-voltage (I-V) characteristics of thin film MIM (metal-insulator-metal) capacitors, which is quite frequently modeled by either the Schottky model or the Poole-Frenkel model. In this letter, the author points out that the two models actually...
محفوظ في:
المؤلف الرئيسي: | Lau, Wai Shing. |
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مؤلفون آخرون: | School of Electrical and Electronic Engineering |
التنسيق: | مقال |
اللغة: | English |
منشور في: |
2013
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الموضوعات: | |
الوصول للمادة أونلاين: | https://hdl.handle.net/10356/100826 http://hdl.handle.net/10220/11050 |
الوسوم: |
إضافة وسم
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المؤسسة: | Nanyang Technological University |
اللغة: | English |
مواد مشابهة
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