An extended unified Schottky-Poole-Frenkel theory to explain the current-voltage characteristics of capacitors using high-k dielectric materials

An extended unified Schottky-Poole-Frenkel theory to explain the current-voltage characteristics of capacitors using high-k dielectric materials

Historically, there is a controversy regarding the current-voltage (I-V) characteristics of thin film MIM (metal-insulator-metal) capacitors, which is quite frequently modeled by either the Schottky model or the Poole-Frenkel model. In this letter, the author points out that the two models actually...

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書目詳細資料
主要作者:	Lau, Wai Shing.
其他作者:	School of Electrical and Electronic Engineering
格式:	Article
語言:	English
出版:	2013
主題:	DRNTU::Engineering::Electrical and electronic engineering
在線閱讀:	https://hdl.handle.net/10356/100826 http://hdl.handle.net/10220/11050
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	Nanyang Technological University
語言:	English

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