Field-driven athermal activation of amorphous metal oxide semiconductors for flexible programmable logic circuits and neuromorphic electronics

Despite extensive research, large-scale realization of metal-oxide electronics is still impeded by high-temperature fabrication, incompatible with flexible substrates. Ideally, an athermal treatment modifying the electronic structure of amorphous metal oxide semiconductors (AMOS) to generate suffici...

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Main Authors: Kulkarni, Mohit Rameshchandra, John, Rohit Abraham, Tiwari, Nidhi, Nirmal, Amoolya, Ng, Si En, Nguyen, Anh Chien, Mathews, Nripan
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2020
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Online Access:https://hdl.handle.net/10356/138083
https://doi.org/10.21979/N9/DWYGO3
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Institution: Nanyang Technological University
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spelling sg-ntu-dr.10356-1380832023-07-14T15:58:16Z Field-driven athermal activation of amorphous metal oxide semiconductors for flexible programmable logic circuits and neuromorphic electronics Kulkarni, Mohit Rameshchandra John, Rohit Abraham Tiwari, Nidhi Nirmal, Amoolya Ng, Si En Nguyen, Anh Chien Mathews, Nripan School of Materials Science & Engineering Engineering::Electrical and electronic engineering::Semiconductors Engineering::Materials::Microelectronics and semiconductor materials Field-driven Athermal Activation Amorphous Metal Oxides Despite extensive research, large-scale realization of metal-oxide electronics is still impeded by high-temperature fabrication, incompatible with flexible substrates. Ideally, an athermal treatment modifying the electronic structure of amorphous metal oxide semiconductors (AMOS) to generate sufficient carrier concentration would help mitigate such high-temperature requirements, enabling realization of high-performance electronics on flexible substrates. Here, a novel field-driven athermal activation of AMOS channels is demonstrated via an electrolyte-gating approach. Facilitating migration of charged oxygen species across the semiconductor–dielectric interface, this approach modulates the local electronic structure of the channel, generating sufficient carriers for charge transport and activating oxygen-compensated thin films. The thin-film transistors (TFTs) investigated here depict an enhancement of linear mobility from 51 to 105.25 cm2 V−1 s−1 (ionic-gated) and from 8.09 to 14.49 cm2 V−1 s−1 (back-gated), by creating additional oxygen vacancies. The accompanying stochiometric transformations, monitored via spectroscopic measurements (X-ray photoelectron spectroscopy) corroborate the detailed electrical (TFT, current evolution) parameter analyses, providing critical insights into the underlying oxygen-vacancy generation mechanism and clearly demonstrating field-induced activation as a promising alternative to conventional high-temperature annealing strategies. Facilitating on-demand active programing of the operation modes of transistors (enhancement vs depletion), this technique paves way for facile fabrication of logic circuits and neuromorphic transistors for bioinspired computing. MOE (Min. of Education, S’pore) Accepted version 2020-04-23T08:58:51Z 2020-04-23T08:58:51Z 2019 Journal Article Kulkarni, M. R., John, R. A., Tiwari, N., Nirmal, A., Ng, S. E., Nguyen, A. C., & Mathews, N. (2019). Field-driven athermal activation of amorphous metal oxide semiconductors for flexible programmable logic circuits and neuromorphic electronics. Small, 15(27), 1901457-. doi:10.1002/smll.201901457 1613-6829 https://hdl.handle.net/10356/138083 10.1002/smll.201901457 27 15 1901457 en Small https://doi.org/10.21979/N9/DWYGO3 This is the peer reviewed version of the following article: Kulkarni, M. R., John, R. A., Tiwari, N., Nirmal, A., Ng, S. E., Nguyen, A. C., & Mathews, N. (2019). Field-driven athermal activation of amorphous metal oxide semiconductors for flexible programmable logic circuits and neuromorphic electronics. Small, 15(27), 1901457-. doi:10.1002/smll.201901457, which has been published in final form at 10.1002/smll.201901457. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions. application/pdf application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Engineering::Electrical and electronic engineering::Semiconductors
Engineering::Materials::Microelectronics and semiconductor materials
Field-driven Athermal Activation
Amorphous Metal Oxides
spellingShingle Engineering::Electrical and electronic engineering::Semiconductors
Engineering::Materials::Microelectronics and semiconductor materials
Field-driven Athermal Activation
Amorphous Metal Oxides
Kulkarni, Mohit Rameshchandra
John, Rohit Abraham
Tiwari, Nidhi
Nirmal, Amoolya
Ng, Si En
Nguyen, Anh Chien
Mathews, Nripan
Field-driven athermal activation of amorphous metal oxide semiconductors for flexible programmable logic circuits and neuromorphic electronics
description Despite extensive research, large-scale realization of metal-oxide electronics is still impeded by high-temperature fabrication, incompatible with flexible substrates. Ideally, an athermal treatment modifying the electronic structure of amorphous metal oxide semiconductors (AMOS) to generate sufficient carrier concentration would help mitigate such high-temperature requirements, enabling realization of high-performance electronics on flexible substrates. Here, a novel field-driven athermal activation of AMOS channels is demonstrated via an electrolyte-gating approach. Facilitating migration of charged oxygen species across the semiconductor–dielectric interface, this approach modulates the local electronic structure of the channel, generating sufficient carriers for charge transport and activating oxygen-compensated thin films. The thin-film transistors (TFTs) investigated here depict an enhancement of linear mobility from 51 to 105.25 cm2 V−1 s−1 (ionic-gated) and from 8.09 to 14.49 cm2 V−1 s−1 (back-gated), by creating additional oxygen vacancies. The accompanying stochiometric transformations, monitored via spectroscopic measurements (X-ray photoelectron spectroscopy) corroborate the detailed electrical (TFT, current evolution) parameter analyses, providing critical insights into the underlying oxygen-vacancy generation mechanism and clearly demonstrating field-induced activation as a promising alternative to conventional high-temperature annealing strategies. Facilitating on-demand active programing of the operation modes of transistors (enhancement vs depletion), this technique paves way for facile fabrication of logic circuits and neuromorphic transistors for bioinspired computing.
author2 School of Materials Science & Engineering
author_facet School of Materials Science & Engineering
Kulkarni, Mohit Rameshchandra
John, Rohit Abraham
Tiwari, Nidhi
Nirmal, Amoolya
Ng, Si En
Nguyen, Anh Chien
Mathews, Nripan
format Article
author Kulkarni, Mohit Rameshchandra
John, Rohit Abraham
Tiwari, Nidhi
Nirmal, Amoolya
Ng, Si En
Nguyen, Anh Chien
Mathews, Nripan
author_sort Kulkarni, Mohit Rameshchandra
title Field-driven athermal activation of amorphous metal oxide semiconductors for flexible programmable logic circuits and neuromorphic electronics
title_short Field-driven athermal activation of amorphous metal oxide semiconductors for flexible programmable logic circuits and neuromorphic electronics
title_full Field-driven athermal activation of amorphous metal oxide semiconductors for flexible programmable logic circuits and neuromorphic electronics
title_fullStr Field-driven athermal activation of amorphous metal oxide semiconductors for flexible programmable logic circuits and neuromorphic electronics
title_full_unstemmed Field-driven athermal activation of amorphous metal oxide semiconductors for flexible programmable logic circuits and neuromorphic electronics
title_sort field-driven athermal activation of amorphous metal oxide semiconductors for flexible programmable logic circuits and neuromorphic electronics
publishDate 2020
url https://hdl.handle.net/10356/138083
https://doi.org/10.21979/N9/DWYGO3
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