Unidirectional threshold switching induced by Cu migration with high selectivity and ultralow OFF current under gradual electroforming treatment
A gradual electroforming process was implemented on the pristine Pt/HfOx/Cu/Pt structure to realize volatile threshold switching characteristics of a diffusive memristor. The reported devices exhibit stable unidirectional threshold switching properties with high selectivity of >107 and ultralow O...
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sg-ntu-dr.10356-1401032023-02-28T19:46:11Z Unidirectional threshold switching induced by Cu migration with high selectivity and ultralow OFF current under gradual electroforming treatment Dananjaya, Putu Andhita Loy, Desmond Jia Jun Chow, Samuel Chen Wai Lew, Wen Siang School of Physical and Mathematical Sciences Science::Physics Threshold Switching Diffusive Memristor A gradual electroforming process was implemented on the pristine Pt/HfOx/Cu/Pt structure to realize volatile threshold switching characteristics of a diffusive memristor. The reported devices exhibit stable unidirectional threshold switching properties with high selectivity of >107 and ultralow OFF current of ∼100 fA for over 104 endurance cycles. Nucleation theory on spheroidal-shaped metallic filament growth is used to extensively discuss the structural changes of the device after gradual forming treatments by analyzing the applied bias amplitude dependency of the finite delay time required by the device to turn ON under external electric field. On the other hand, the Rayleigh instability model was implemented for the aforementioned spheroidal metallic nucleus to explain the relaxation dynamics of the device. It was shown that the relaxation time of the device depends on the initial profile of the nucleus within the insulating layer. The broadening of the ON current distribution of the device was observed during the device endurance test. This is correlated to the presence of a random telegraph signal (RTS) during the ON state of the device. ASTAR (Agency for Sci., Tech. and Research, S’pore) Accepted version 2020-05-26T07:49:20Z 2020-05-26T07:49:20Z 2019 Journal Article Dananjaya, P. A., Loy, D. J. J., Chow, S. C. W., & Lew, W. S. (2019). Unidirectional threshold switching induced by Cu migration with high selectivity and ultralow OFF current under gradual electroforming treatment. ACS Applied Electronic Materials, 1(10), 2076-2085. doi:10.1021/acsaelm.9b00446 2637-6113 https://hdl.handle.net/10356/140103 10.1021/acsaelm.9b00446 10 1 2076 2085 en ACS Applied Electronic Materials This document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS Applied Electronic Materials, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://doi.org/10.1021/acsaelm.9b00446 application/pdf |
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Science::Physics Threshold Switching Diffusive Memristor Dananjaya, Putu Andhita Loy, Desmond Jia Jun Chow, Samuel Chen Wai Lew, Wen Siang Unidirectional threshold switching induced by Cu migration with high selectivity and ultralow OFF current under gradual electroforming treatment |
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A gradual electroforming process was implemented on the pristine Pt/HfOx/Cu/Pt structure to realize volatile threshold switching characteristics of a diffusive memristor. The reported devices exhibit stable unidirectional threshold switching properties with high selectivity of >107 and ultralow OFF current of ∼100 fA for over 104 endurance cycles. Nucleation theory on spheroidal-shaped metallic filament growth is used to extensively discuss the structural changes of the device after gradual forming treatments by analyzing the applied bias amplitude dependency of the finite delay time required by the device to turn ON under external electric field. On the other hand, the Rayleigh instability model was implemented for the aforementioned spheroidal metallic nucleus to explain the relaxation dynamics of the device. It was shown that the relaxation time of the device depends on the initial profile of the nucleus within the insulating layer. The broadening of the ON current distribution of the device was observed during the device endurance test. This is correlated to the presence of a random telegraph signal (RTS) during the ON state of the device. |
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School of Physical and Mathematical Sciences |
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School of Physical and Mathematical Sciences Dananjaya, Putu Andhita Loy, Desmond Jia Jun Chow, Samuel Chen Wai Lew, Wen Siang |
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Article |
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Dananjaya, Putu Andhita Loy, Desmond Jia Jun Chow, Samuel Chen Wai Lew, Wen Siang |
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Dananjaya, Putu Andhita |
title |
Unidirectional threshold switching induced by Cu migration with high selectivity and ultralow OFF current under gradual electroforming treatment |
title_short |
Unidirectional threshold switching induced by Cu migration with high selectivity and ultralow OFF current under gradual electroforming treatment |
title_full |
Unidirectional threshold switching induced by Cu migration with high selectivity and ultralow OFF current under gradual electroforming treatment |
title_fullStr |
Unidirectional threshold switching induced by Cu migration with high selectivity and ultralow OFF current under gradual electroforming treatment |
title_full_unstemmed |
Unidirectional threshold switching induced by Cu migration with high selectivity and ultralow OFF current under gradual electroforming treatment |
title_sort |
unidirectional threshold switching induced by cu migration with high selectivity and ultralow off current under gradual electroforming treatment |
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2020 |
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https://hdl.handle.net/10356/140103 |
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