Thermal conductivity measurement of nanostructures

Thermal conductivity measurement of nanostructures

This experiment presents to you the extraction of thermal properties of single wall carbon nanotube bundles from our 3 layered samples using the Pulsed Photothermal Reflectance technique. The top layer of the sample is a gold film, the second layer is silicon dioxide or CNT array and the bottom laye...

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書目詳細資料
主要作者:	Lim, Yuwei.
其他作者:	George Chung Kit Chen
格式:	Final Year Project
語言:	English
出版:	2009
主題:	DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics
在線閱讀:	http://hdl.handle.net/10356/14742
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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