The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy

The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy

The effect of chromatic aberration (CC) on the spatial resolution in transmission electron microscopy (TEM) was studied in thick specimens in which the sample becomes the limiting factor in the resolution. The sample influences the energy spread of the electron beam, allows only a limited electron d...

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Bibliographic Details
Main Authors: Ortega, Eduardo, Boothroyd, Chris, de Jonge, Niels
Other Authors: School of Materials Science and Engineering
Format: Article
Language:English
Published: 2023
Subjects:
Engineering::Materials
Chromatic Aberration
Electron Scattering
Online Access:https://hdl.handle.net/10356/165539
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Institution: Nanyang Technological University
Language: English

Internet

https://hdl.handle.net/10356/165539

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