The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy

The effect of chromatic aberration (CC) on the spatial resolution in transmission electron microscopy (TEM) was studied in thick specimens in which the sample becomes the limiting factor in the resolution. The sample influences the energy spread of the electron beam, allows only a limited electron d...

Full description

Saved in:
Bibliographic Details
Main Authors: Ortega, Eduardo, Boothroyd, Chris, de Jonge, Niels
Other Authors: School of Materials Science and Engineering
Format: Article
Language:English
Published: 2023
Subjects:
Online Access:https://hdl.handle.net/10356/165539
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English

Similar Items