The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy

• Main Authors: Ortega, Eduardo, Boothroyd, Chris, de Jonge, Niels
• Other Authors: School of Materials Science and Engineering
• Format: Article
• Language: English
• Published: 2023
• Subjects: Engineering::Materials; Chromatic Aberration; Electron Scattering
• Online Access: https://hdl.handle.net/10356/165539
• Institution: Nanyang Technological University

The effect of chromatic aberration (CC) on the spatial resolution in transmission electron microscopy (TEM) was studied in thick specimens in which the sample becomes the limiting factor in the resolution. The sample influences the energy spread of the electron beam, allows only a limited electron d...