Implementation of industry-standard functional coverage in UVM testbench for SoC level verification

• المؤلف الرئيسي: Zhang, Shaoyan
• مؤلفون آخرون: Lin Zhiping
• التنسيق: Thesis-Master by Coursework
• اللغة: English
• منشور في: Nanyang Technological University 2023
• الموضوعات: Engineering::Electrical and electronic engineering
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/166397
• المؤسسة: Nanyang Technological University

As ICs（Integrated Circuits）process technologies and SoC (system-on-chip) design techniques continue to advance, IC chip designs continue to grow in size and complexity. Verification IP automates the generation of test stimulus, data comparison and coverage statistics, and its verification components...