Implementation of industry-standard functional coverage in UVM testbench for SoC level verification

As ICs(Integrated Circuits)process technologies and SoC (system-on-chip) design techniques continue to advance, IC chip designs continue to grow in size and complexity. Verification IP automates the generation of test stimulus, data comparison and coverage statistics, and its verification components...

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書目詳細資料
主要作者: Zhang, Shaoyan
其他作者: Lin Zhiping
格式: Thesis-Master by Coursework
語言:English
出版: Nanyang Technological University 2023
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在線閱讀:https://hdl.handle.net/10356/166397
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