RF SOI EDMOS – reliability measurement

• Main Author: Koh, Jin Rong
• Other Authors: Ang Diing Shenp
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2023
• Subjects: Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/167519
• Institution: Nanyang Technological University

This project focuses on investigating the impact of Hot-Carrier Stress (HCS) on the performance of the EDNMOS transistors. The aim is to gain a better understanding of the Hot-Carrier Degradation (HCD) effects on the EDNMOS, which is important for improving the reliability and lifespan of such devic...